Have you ever de-magnified when imaging in your electron microscope and notice dark scanlines on your sample?
The Scanning Electron Microscope (SEM) requires a source of electrons to form a beam and can utilize various emitters.
In this article, we will identify target material options for use in your specimen coater when analyzing a non-conductive sample.
Epoxies have a wide range of applications in microscopy sample preparation and vacuum chamber feedthroughs or leak repairs.
Standard SEM stubs and mounts are used as substrates to mount samples for Scanning Electron Microscopy (SEM).
In an SEM sputter coater for coating non-conductive SEM samples, a plasma is created at a vacuum level of around 2x10-1 to 2x10-2 mbar by applying a high voltage between the grounded sample stage and the target.
Although modern manufacturing techniques have greatly improved the accuracy of SEMs, it is good practice to regularly check if the magnification shown on the SEM is still correct.