FIB-SEM Pre-tilt Specimen Holders

FIB SEM pre tilt specimen holder category

Overview

When a user needs to position a sample perpendicular with the FIB column to allow for straight FIB milling into the surface of the sample, pre-tilt stub holders can be extremely useful. The pre-tilt angles are complementary to the angle of the FIB column and are custom designed for ZEISS, TESCAN and FEI FIB-SEM workstations. Three pre-tilt holders are available:



Available in the following types:

  • EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for FEI Dual Beam FIB systems. Size w.o. pin is Ø12.7x17mm.
  • EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam FIB systems. Size w.o. pin is Ø12.7x17mm.
  • EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.

Product #StyleAngleFIB-SEMCapacitySize w/o pinStub holding method
RS-MN-10-002235 P35 35° Tescan Ø3.2mm pin Ø12.7x17mm Set Screw
RS-MN-10-002236 P36 36° ZEISS Ø3.2mm pin Ø12.7x17mm Set Screw
RS-MN-10-002238 P38 38° FEI Ø3.2mm pin Ø12.7x17mm Set Screw
 

Price

$53.32 each

EM-Tec P35 fixed 35°pre-tilt holder for Tescan FIB systems, Ø12.7x17mm, pin

each

 

Price

$53.32 each

 

Price

$53.32 each

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