FIB-SEM Pre-tilt Specimen Holders

FIB SEM pre tilt specimen holder category

Overview

When a user needs to position a sample perpendicular with the FIB column to allow for straight FIB milling into the surface of the sample, pre-tilt stub holders can be extremely useful. The pre-tilt angles are complementary to the angle of the FIB column and are custom designed for ZEISS, TESCAN and FEI FIB-SEM workstations. Three pre-tilt holders are available:

Available in the following types:

EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for FEI Dual Beam FIB systems. Size w.o. pin is Ø12.7x17mm.
EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam FIB systems. Size w.o. pin is Ø12.7x17mm.
EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.

Product #	Style	Angle	FIB-SEM	Capacity	Size w/o pin	Stub holding method
RS-MN-10-002235	P35	35°	Tescan	Ø3.2mm pin	Ø12.7x17mm	Set Screw
RS-MN-10-002236	P36	36°	ZEISS	Ø3.2mm pin	Ø12.7x17mm	Set Screw
RS-MN-10-002238	P38	38°	FEI	Ø3.2mm pin	Ø12.7x17mm	Set Screw