Rave-Tec CXS calibration and reference standards for EDS, WDS, BSD, CL and Raman                                           Overview Calibration Standards                      Stub Adapters                Stage Adapters            Metallographic Mounts

                                                                                                                                    

Overview                                                                                                                                     

36 000710

 

EDS analysis is one of the key applications with a scanning electron microscope. To ensure accuracy in analysis it is important that all detectors are properly  calibrated. Rave Scientific offers the EM-Tec CXS calibration and reference standards. These standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks. They are available on two types of practical and compact pin stubs:

 

  • Compact Ø12.7mm standard aluminum pin stub with up to 10 elements/compounds.
  • Ø25.4 mm AISI303 stainless steel pin stub for larger numbers of element/compounds. The Ø25.4 mm mounts are compatible with the EM-Tec M26 metallographic. The EM-Tec M26 metallographic mount holder is available with an M4 screw or standard Pin. In the case of the Zeiss short 6mm pin, we suggest the EM-Tec M26, M4 with an M4 to Zeiss Stub adapter.

 


The elements/compounds are all mounted with highly conductive and vacuum compatible silver filled epoxy. The mounts are then polished to ensure that all the elements/compounds are in the same plane. Virtually all standards include a Faraday cup to enable electron probe measurements and monitoring. The calibration standards with non-conductive elements/compounds are carbon coated to ensure conductivity and avoid charging.
The pin stub type standards are compatible with FEI, Philips, Zeiss, Leo, Tescan, Phenom, Aspex, Leica, Cambridge instrument and CamScan SEMs. For using the calibration standards on JEOL and Hitachi SEM, please consult the page with the EM-Tec SEM stub adapters.

The EM-Tec calibration and reference standards are intended for calibration and testing of:
- SEM/EDS systems and/or SEM / WDS systems
- SEM back scattered electron detector (BSD)
- SEM cathode-luminescence (CL) detector
- SEM/Raman system
 -SEM/Micro-XRF systems
- Micro-XRF systems

 

 Overview and specifications of the various EM-Tec CXS calibration and reference standards

Product #

Type

Calibration application description

Standards #

Far. cup

Size

RS-MN-36-000505

CXS-5F

Light elements, EDS detector

5

Yes

12.7mm x pin

RS-MN-36-000506

CXS-5C

Light elements, EDS detector, Image

5

No

12.7mm x pin

RS-MN-36-000507

CXS-5BE

BSD, EDS detector

5

Yes

12.7mm x pin

RS-MN-36-000522

CXS-6BE

BSD, EDS detector

6

Yes

12.7mm x pin

RS-MN-36-000510

CXS-10BE

BSD, EDS detector

10

Yes

12.7mm x pin

RS-MN-36-000508

CXS-5N

Light elements, EDS detector

5

Yes

12.7mm x pin

RS-MN-36-000512

CXS-5LE

Light elements detection performance

5

Yes

12.7mm x pin

RS-MN-36-000513

CXS-5TX

EDAX  TEX set-up

5

Yes

12.7mm x pin

RS-MN-36-000514

CXS-5LX

EDAX LEX / TEX set-up

5

Yes

12.7mm x pin

RS-MN-36-000517

CXS-6F

EDS detector & performance

6

Yes

12.7mm x pin

RS-MN-36-000521

CXS-6LE

Light elements, EDS detector

6

Yes

12.7mm x pin

RS-MN-36-000618

RXS-18RE

Rare earth metals reference

18

Yes

25.4mm x pin

RS-MN-36-000621

RXS-21RE

Rare earth metals reference

21

Yes

25.4mm x pin

RS-MN-36-000636

RXS-36M

Metals reference

36

Yes

25.4mm x pin

RS-MN-36-000640

RXS-40MC

Mineral & compounds reference

40

Yes

25.4mm x pin

RS-MN-36-000707

RXS-6CL

Cathode-luminescence reference

7

Yes

12.7mm x pin

RS-MN-36-000710

RXS-10PD

Peak deconvolution, resolution test

10

Yes

12.7mm x pin

RS-MN-36-000711

RXS-10RA

Raman performance

10

Yes

12.7mm x pin

RS-MN-36-000712

RXC-2WSi

Fusion, BSD/X-ray contrast & resolution

2

No

12.7mm x pin

RS-MN-36-000714

RXC-2TaSi

Fusion, BSD/X-ray contrast & resolution

2

No

12.7mm x pin

 

 

 

EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub

36 000505 EM Tec CXS 5FThe EM-Tec CXS-5F calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. The copper Faraday cup and aluminum pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test. Reference materials: Stainless steel (SRM 1155), Sio2, Mn, B and C. 200µm copper Faraday cup.

 

EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub

rs mn 36 000506The EM-Tec CXS-5C calibration standard includes 5 reference materials and a 200mesh copper grid All mounted in a compact Ø12.7mm standard aluminium pin stub. The 200mesh copper grid acts as an image size reference and with the aluminium pin stub it serves as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test. Reference materials: Stainless steel (SRM 1155), Sio2, Mn, B and C. 200mesh copper grid.

EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub

rs mn 36 000507The EM-Tec CXS-5BE calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up. Reference materials: Au, Nb, Ge, Si and C. 200µm copper Faraday cup.

Product Part Number Price
EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub RS-MN-36-000507 $574.65 each
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EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub

rs mn 36 000522The EM-Tec CXS-6BE calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up. Reference materials: Au, Rh, Ge, Co, Si and C. 200µm copper Faraday cup.

Product Part Number Price
EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub RS-MN-36-000522 $685.32 each
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EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub

rs mn 36 000510The EM-Tec CXS-10BE calibration standard includes 10 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. The copper Faraday cup and aluminum pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up. Reference materials: Bi, Ir, Ho, Sn, Sb, Nb, Ge, Co, Ti, Si and C. 200µm copper Faraday cup. RAVE PRODUCTS Sample Preparation Vacuum Supplies FIB-SEM Workstation Supplies Filaments and Cathodes SEM Supplies TEM Supplies AFM / SPM Supplies Calibration Standards Light Microscopy Supplies SEM Starter Kits TEM Starter Kits Acoustic Enclosures

Product Part Number Price
EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub RS-MN-36-000510 $942.65 each
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EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub

rs mn 36 000508The EM-Tec CXS-5F calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test. Similar to #36-00505; EM-Tec CXS-5F, but with BN instead of B to add N. Reference materials: Stainless steel (SRM 1155), Sio2, Mn, BN and C. 200µm copper Faraday cup.

EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub

rs mn 36 000512The EM-Tec CXS-5LE calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: light element performance test and EDS detector setup; includes: B, C, N, O and F in stable compounds. Reference materials: CaB6, SiC, CrN, Fe2o3 and CaF2. 200µm copper Faraday cup.

EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub

rs mn 36 000513The EM-Tec CXS-5LX calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. The copper Faraday cup and aluminum pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: setting up EDAX detectors and EDS systems including light elements. Reference materials: Mo, Cu, SiO2, BN and C. 200µm copper Faraday cup.

Product Part Number Price
EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub RS-MN-36-000513 $462.65 each
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EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub

rs mn 36 000514The EM-Tec CXS-5LX calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. The copper Faraday cup and aluminum pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: setting up EDAX detectors and EDS systems including light elements. Reference materials: Mo, Cu, SiO2, BN and C. 200µm copper Faraday cup.

Product Part Number Price
EM-Tec CXS-5TX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub RS-MN-36-000514 $685.32 each
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EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub

rs mn 36 000517The EM-Tec CXS-6F calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. The copper Faraday cup and aluminum pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution and EDS detector calibration. Reference materials: Cu, Mn, Ti, CaCo3, B and C. 200µm copper Faraday cup.

EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub

rs mn 36 000521The EM-Tec CXS-6LE calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. The copper Faraday cup and aluminum pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test. Reference materials: Stainless steel 316, Mn, Ti, CaCo3, PFTE and BN. 200µm copper Faraday cup.

EM-Tec M26 metallographic calibration mount holder for Ø25mm / Ø1inch mounts, pin

11 000227 Pin stub adapters for 25mm JEOL and Hiachi stubs

EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub

18 standardsThe EM-Tec RXS-18RE reference standard includes 18 reference rare earth elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9mm high stainless steel 303 block. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. Reference materials: LaF3, Ceo2, Pr, Nd, Sm, EuF3, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Sc, Y, U and C. 200µm copper Faraday cup. Sensitive to air, must be stored under vacuum or inert gas.

Product Part Number Price
EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on pin stub RS-MN-36-000618 $2,571.99 each
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EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub

rs mn 36 000621The EM-Tec RXS-21RE reference standard includes 21 reference rare earth elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9mm high stainless steel 303 block. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. Reference materials: LaF3, Ceo2, PrSi2, NdSi2, Sm, EuF3, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Gd3Ga5O12, Sc, Y, U, ThF4, B and C. 200µm copper Faraday cup. Preferably stored under vacuum or inert gas.

Product Part Number Price
EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on pin stub RS-MN-36-000621 $2,914.65 each
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EM-Tec RXS-40MM metals & mineral reference standard, 40 standards plus F/C on stainless steel Ø 25.4 mm pin stub

rs mn 36 000642The EM-Tec RXS-40MM metals & minerals reference standard includes 40 standards and a 200µm aperture copper Faraday cup. The standards are: 27 reference metals, 5 compounds and 8 minerals. All mounted in a Ø25.4 mm standard pin stub, made from AISI 303 stainless steel. The standard is carbon coated for conductivity. The stoichiometric compositions of the natural minerals are nominal; other impurities may be present. Intended as reference standard for quantitative EDS and WDS micro-analysis applications with the following elements: Ag, Al, As, Au, Ba, Bi, Ca, Ce, Cl, Co, Cr, Cu, F, Fe, Ga, Ge, Hf, In, K, Mg, Mn, Mo, Na, Nb, Ni, O, P, Pb, Pt, Re, Rh, S, Sb, Se, Si, Sn, Ta, Te, Ti, V, W, Y, Zn, Zr 
The EM-Tec RXS-40MM includes 27 single elements, 5 compounds & 8 minerals: 

CaF2
CeO2
GaAs
InP
PbTe
28 Baryte BaSO4
29 Pyromorphite Pb5(PO4)3Cl
31 Haemetite Fe2O3
32 Pyrite FeS2
35 Adularia KAl2Si3O8
36 Spinel (synthetic) MgAl2O3
37 YAG (synthetic) Y3Al5O12
39 Albite NaALSi3O8

EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub

36 000636The EM-Tec RXS-36M metals reference standard includes 36 reference metal elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9mm high stainless steel 303 block. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. Reference materials: C, Al, Si, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ge, Se, Sc, Y, Zr, Mo, Nb, Sn, Sb, Ru, Rh, Pd, Ag, Te, Hf, Ta, W, Re, Os, Ir, Au, Bi, Pt and U. 200µm copper Faraday cup.

Product Part Number Price
EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on pin stub RS-MN-36-000636 $1,666.67 each
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EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub

rs mn 36 000640The EM-Tec RXS-40MC minerals reference standard includes 40 reference minerals and a 200µm aperture copper Faraday cup. All mounted in a standard Ø25.4 pin stub, made from AISI 303 stainless steel. All minerals are embedded in conductive silver filled epoxy. The stociometric compositions of these natural minerals are nominal; other impurities may be present. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. 200µm copper Faraday cup and 40 minerals: 1 Albite A NaALSi3O8, 2 Albite B NaALSi3O8, 3 Pyrite FeS2, 4 Marcasite FeS2, 5 Wurtztite (Zn, Fe)S, 6 Siderite FECO3, 7 Marmarite (Zn, Fe)S, 8 Aragonite CaCO3, 9 Calcite CaCO3, 10 Barytes BaSO4, 11 Benitoite BaTiSi3O9, 12 Fluorite CaF2, 13 Dolomite (CaMg)(CO3)2, 14 YAG (synthetic) Y3Al5O12, 15 Perovskite CaTiO3, 16 Sphene CaTiSiO5, 17 Scheelite, 18 Tausonite (synthetic) SrTiO3, 19 Enargite Cu3AsS4, 20 Haemetite Fe2O3, 21 Magnetite Fe3O4, 22 Cuprite Cu2O, 23 Chrysoberyl (synthetic) Be3Al2O4, 24 Wulfrenite PbMoO4, 25 Cerrusite PbCO3, 26 Vanadinite [Pb(VO4)3]Cl, 27 Apatite Ca5(PO4)3(F,Cl,OH), 28 Casserite SnO2, 29 Celestite SrSO4, 30 Rutile TiO2, 31 Anastase TiO2, 32 Brookite TiO2, 33 Gypsum CaSO4.2H2O, 34 Baddeleyte ZrO2, 35 Zirconia (synthetic) ZrO2 (8 mole% Y2O3), 36 Beryl (Be3Al2(SiO3)6), 37 Adularia (KAlSi3O8), 38 Quartz SiO2, 39 Spinel (synthetic) MgAl2O4, 40 Corundum Al2O3

Product Part Number Price
EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on pin stub RS-MN-36-000640 $2,571.99 each
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EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub

rs mn 36 000707The EM-Tec RXS-7CL test standard includes 7 reference compounds. All mounted in a compact Ø12.7mm standard aluminum pin stub. Intended for testing cathode-luminescence detector and spectrometer performance. Reference materials: Benitoite, Chrysoberyl, Apatite, Fluorite, Spinel, Calcite and Corundum.

Product Part Number Price
EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub RS-MN-36-000707 $685.32 each
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EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub

rs mn 36 000710The EM-Tec RXS-10PD peak deconvolution test standard includes 10 reference compounds and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. Intended for testing EDS and WDS spectrometer performance and as reference with overlapping materials. Reference materials: Molybdenite (MoS2), Zinkenite (Pb9Sb22S42), Galena (PbS), Cinnabar (HgS), Wulfrenite (PbMoO4), Benitoite (BaTiSiO9), Galkhaite ((Cs,Tl)(Hg, Cu, Zn)6(As)4S12+trace Sb, Kleinite (Hg2N(ClSO4).n(H2O), Kosnarite (KZr(PO)3) and Enargite (Cu3AsS4). 200µm copper Faraday cup.

EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub

rs mn 36 000711The EM-Tec RXS-10RA reference standard includes 10 reference compounds and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminum pin stub. Intended for performance testing for Raman mineral analysis. Reference materials: Silica, Quartz, Aragonite, Calcite, Chalcedony, Pyrite, Marcasite, Rutile, Anastase and Brookite. 200µm copper Faraday cup.

EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si plus F/C on pin stub

rs mn 36 000712The EM-Tec RXS-2WSi contrast test standard includes fused W and Si. Mounted in a compact Ø12.7mm standard aluminum pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters. Reference materials: Fused W / Si. 200µm copper Faraday cup.

EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub

rs mn 36 000714The EM-Tec RXS-2WSi contrast test standard includes fused W and Si. Mounted in a compact Ø12.7mm standard aluminum pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters. Reference materials: Fused W / Si. 200µm copper Faraday cup.