MEL BUILD In-situ Nano Order Tensile TEM Holder
The MEL-BUILD Nano-Order Tensile TEM holder is capable of implementing external stimuli to observe real-time sample dynamics. During tensile testing, sequences of TEM images including morphology, selected area electron diffraction (SAED) and high-resolution lattice images can be acquired. The major advantage of this technique is its capability to use TEM imaging solely for high magnification micro-structural observations and conduct more complex in-situ TEM testing such as fatigue tests.
MEL-BUILD In-Situ Nano Order TEM Holder Specifications
High-Angle Triple-Axis tem holder
Applicable instrument:
TFS Tecnai, Titan, JEOL HR pole piece type
Maximum X (α) tilt range +/-80°
(Limited by the Gonio stage tilt angle.)
Maximum Y (β) tilt range +/- 7.50°
Supports high-resolution
| Material Model | |
|---|---|
| Tensile resolution: | 1nm/step 3nm/dec |
| Tensile Distance: | 200μm |
| Tilt Angle: | TFS ±65° JEOL HR PP ±60°/ UHR PP ±10° |
| Cartridge Model: | Prepare FIB and Bulk sample |
| Soft Material Model | |
| Tensile resolution: | 1nm/step 3nm/dec |
| Tensile Distance: | JEOL Model 800% TFS 200% |
| Tilt Angle: | JEOL HR PP ±20°/ UHR PP ±10° TFS ±20° |
| Cyclic Straining Mode: | JEOL Available TFS Not Function |
| Cartridge Model: | Prepare Microtome and FIB |