SEM Sample Stubs 

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Overview

Rave Scientific offers a variety of SEM sample stubs that are compatible with all respective brands of electron microscopes. Our wide selection of platforms accommodate a variety of sample sizes and are available with 45°, 45/90° and even double 90° pre-tilt.here are four major types of SEM sample stubs:

• Standard pin stubs with 9.5mm pin length for FEI, Philips, Tescan, Phenom, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, RJLee, Etec and Novascan SEMs
• Short pin Zeiss stubs with 6mm length for Zeiss and LEO SEMs
• JEOL cylinder stubs for JEOL SEMs
• Hitachi M4 cylinder stubs with an M4 threaded hole in the base

Dish Type SEM sample stubs for working in Solutions or fluids

To prepare solution or fluids directly on the SEM stub there are dish type SEM sample stubs.

• Standard pins stub SEMs such as FEI, Tescan, Phenom, etc
• JEOL SEMs
• Hitachi SEMs

Less Common Brands and Special SEM Stages

There is also a selection of specialty SEM sample stubs which are used in less common brands or on special SEM stages. Examples are:

• ISI/ABT/Topcon cylinder stubs
• Hitachi In Lens Stubs
• Hitachi pin stubs with M6 thread
• Gatan 3View pin stubs

SEM sample stub adapters for use across different SEM platforms
If you wish to use one type of SEM sample stub across different SEM platforms, you have to use an SEM sample stub adapter. Our large selection of SEM stub adapters can be found on this page:

• SEM sample stub adapters.