The World’s Fastest Scanning Electron Microscopes

Revolutionize the Speed of Electron Microscopy-With the ZEISS MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution. This unique scanning electron microscope (SEM) is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and your MultiSEM will acquire high contrast images automatically, all by itself. You control MultiSEM with the proven ZEN imaging software from ZEISS: all options of this powerful SEM are organized in an intuitive yet flexible way.  The ZEISS MultiSEM unleashes the speed of the scanning electron microscope. At last, you can image huge samples at nanometer resolution, driven by the unrivaled acquisition speed of MultiSEM. MultiSEM is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow. Then get on with your day while MultiSEM takes high contrast images all by itself – no supervision needed. MultiSEM uses ZEN imaging software, so you can control this powerful microscope in an intuitive yet flexible way. Automated tuning routines make sure you achieve the best high resolution data.