FIB-SEM Low-Profile Specimen Stubs

category fib low profile holders

Overview

Rave Scientific offers the following low profile pin mounts that have been especially designed for FIB-SEM applications to bring samples close in working distance. They are available as flat, vertical and complementary tilt versions of the standard ∅12.7mm pin stub. The complimentary tilt version allows positioning of the sample surface flat under the FIB column without the need to tilt the stage. The tilt angle is relative to the vertical electron beam column of the FIB/SEM systems and all holders are compatible with FEI, TESCAN and ZEISS FIB-SEM workstations. All holders are made from vacuum grade aluminum and fully compatible with the standard pin stubs for storage and handling.



Available in the following types:

  • Low profile flat horizontal pin mount with standard or short pin
  • Low profile 90° vertical pin mount with standard or short pin
  • 38° complimentary angle pin mount for FEI DualBeam and FIB/SEM systems
  • 36° complimentary angle pin mount for ZEISS CrossBeam and FIB/SEM systems
  • 35° complimentary angle pin mount for TESCAN LYRA systems.

Specifications for Low Profile Holders


ProductAngleFIB-SEMDiameterStandard PinShort PinGrooved Side
RS-MN-10-002112 FEI, Tescan ∅12.7mm X    
RS-MN-10-002114 90° FEI, Tescan ∅12.7mm X   X
RS-MN-10-002115 35° Tescan ∅12.7mm X   X
RS-MN-10-002118 38° FEI, Tescan ∅12.7mm     X
RS-MN-10-003112 ZEISS ∅12.7mm   X  
RS-MN-10-003114 90° ZEISS ∅12.7mm   X X
RS-MN-10-003116 36° ZEISS ∅12.7mm   X X

Low profile aluminum grade SEM pin stub ∅12.7 diameter with 1mm height for FEI or TESCAN Systems

Low profile aluminum grade SEM pin stub 12.7 diameter with 1mm height for FEI or TESCAN Systems

EM-Tech Low profile "Zia Special" SEM pin stub Ø25mm diameter with 1mm height, aluminum

10 002026

Low profile aluminum grade SEM pin stub ∅12.7 diameter with 90º of pre-tilt for FEI or TESCAN Systems.

Low profile aluminum grade SEM pin stub 12.7 diameter with 90º of pre-tilt for FEI or TESCAN Systems.

Low profile aluminum grade SEM pin stub ∅12.7 diameter with 35º of pre-tilt for Tescan FIB-SEM Workstations.

Low profile aluminum grade SEM pin stub 12.7 diameter with 35º of pre-tilt  for Tescan FIB-SEM Workstations.

Low profile aluminum grade SEM pin stub ∅12.7 diameter with 38° of pre-tilt for FEI FIB-SEM Workstations.

Low profile aluminum grade SEM pin stub ∅12.7 diameter with 38° of pre-tilt for FEI FIB-SEM Workstations.

Low profile Zeiss aluminum grade pin stub 12.7 ∅diameter with 1mm height, short pin.

Low profile Zeiss aluminum grade pin stub 12.7 ∅diameter with 1mm height, short pin.

Low profile aluminum grade SEM pin stub 12.7 ∅ diameter with 90° of pre-tilt for ZEISS Crossbeam Systems.

Low profile aluminum grade SEM pin stub 12.7 ∅ diameter with 90° of pre-tilt for ZEISS Crossbeam Systems.

Low profile aluminum grade SEM pin stub 12.7 ∅ diameter with 36° of pre-tilt for Zeiss Crossbeam Workstations.

Low profile aluminum grade SEM pin stub 12.7 ∅ diameter with 36° of pre-tilt for Zeiss Crossbeam Workstations.