EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub RS-MN-36-000714

The EM-Tec RXS-2TaSi contrast test standard includes fused Ta and Si. Mounted in a compact Ø12.7mm standard aluminum pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters.Reference materials: Fused Ta / Si. 200µm copper Faraday cup.