The Mel Build three-grid double-tilt holder improves semiconductor TEM throughput by loading three specimens in a single insertion.
- ±20degree High throughput, double tilt, multi-sample TEM holder
- Fine Double Tilt Controller 0.01 degree step
The practical advantages are:
- Less exchange downtime: Analyze three grids before removing the holder, reducing repeated loading, airlock pump-down, and stabilization.
- Faster semiconductor comparisons: Batch FIB lamellae from different wafer locations, process conditions, or good-versus-failed devices.
- More productive TEM hours: Particularly useful when screening many samples with relatively short acquisition times.
ー Easy Sample Clamp Structure ー
This holder allows you to easily attach three samples and switch samples within the TEM, achieving overwhelming throughput.
It is especially recommended for people such as semiconductor companies who observe many samples in a day.
Time and Yield Estimates:
