Rave Scientific
Nanotechnology Instrument Providers and Consultants
My Cart
- You are here:
- Rave Scientific
- Sample Preparation
- Sputter Targets
- Gold/Palladium Target, Ø60 x 0.2mm Disc, Au/Pd 60/40, 99.99% Au/Pd
- SEM Sample Holders
- (Overview of Sample Holders)
- Angled and Tilt holders
- Bulk SEM sample holders
- Centering vise holder
- C-Square Muti Pin Holders
- Compact and universal vises
- EBSD sample holders
- FIB grid holders
- Filter Disk Holders
- Geological slide holders
- Gripping stub & stub vises
- Metallographic standard and reference sample holders
- Multiple Hitachi stub holders
- Multiple JEOL stub holders
- Multiple pin stub holders
- Multi XL holder large
- Non Magnetic Sample Holders
- S Clip Sample Holders
- Sample Clamp holders
- Small sample holders
- Small vise holders
- Soft jaw lining kit
- STEM imaging holder
- Swivel tilt sample holders
- TEM grid holders
- Transmission EBSD sample holders for TEM and FIB grids
- Universal sample holder kit
- Versa-Plate Adaptable Holder
- Versatile vise clamp holders
- Wafer holders
- XT stage extender strips
- °360°/90°off-set holder
- Sample Preparation
- Overview-Sample Preparation
- Applicators and Swabs
- Carbon Rods & Fibers
- Conductive Adhesives
- Cutting Tools
- Gloves & Cleaning Supplies
- Lab Scissors
- Non-Conductive Adhesives
- Plastic Transfer Pipettes
- Preparation Mats and Tiles
- Probes and Picks
- SEM Preparation Stands
- SEM-TEM Remote Plasma Cleaner
- Sputter Targets
- Stainless Steel Mesh
- Supports and Substrates
- Tweezers
- Overview Tweezers
- High Precision Tweezers
- High Prec. Reverse Tweezers
- High Prec. Locking Tweezers
- High Prec. Mini Tweezers
- High Prec. Slim tweezers
- High Prec. Titanium Tweezers
- High Pr. Super Alloy Tweezers
- Cutting Tweezers
- SEM Stub Gripper Tweezers
- Cryo Grid Box Tweezers
- AFM/SPM cantilever tweezers
- AFM/SPM Disc tweezers
- Gatan 3View Pin Tweezers
- Wafer Handling Tweezers
- Plastic Tweezers
- Repl. Plastic Tip Tweezers
- Repl. ESD Ceramic Tip Tw.
- Repl. Ceramic Tips Tw.
- Value-Tec Fine Tweezers
- Value-Tec Ceramic Tip Tw.
- Value-Tec Fibre Grip Tweezers
- Value-Tec Strong Tweezers
- Tools
- Tousimis Critical Point Dryer
- Conductive SEM Coating Fluid
- EM Filaments
- SEM Sample Stubs
- Sample Stub Adapters
- JEOL SEM Supplies
- Overview JEOL SEM Supplies
- JEOL Tungsten Filaments
- Vacuum Storage-JEOL
- JEOL SEM Sample Holders
- JEOL Calibration Standards
- Desktop-NEOSCOPE SEM Supplies
- Desktop-NEOSCOPE SEM Holders
- JEOL Multi-Stub Holders
- JEOL Denka Lab6 Emitters
- JEOL Particle Analysis Holders
- JEOL SEM Stubs
- JEOL SEM Holder Adapters
- Sample Preparation Stands-JEOL
- Sample Storage-JEOL
- In-Situ Chamber Plasma Cleaner-JEOL
- SEM Stub Gripper-JEOL
- Hitachi SEM Supplies
- Overview Hitachi SEM Supplies
- Hitachi Calibration Standards
- HITACHI TM Desktop SEM Supplies
- HITACHI TM Desktop SEM Holders
- HITACHI -In Lens Sample Stubs
- HITACHI Multiple Stub SEM Holders
- HITACHI Particle Analysis Holders
- HITACHI M4 Stubs
- HITACHI SEM Holder Adapters
- HITACHI Tungsten Filaments
- Sample Preparation Stands-HITACHI
- Sample Storage-HITACHI
- HITACHI Sample Holders
- Vacuum Storage-HITACHI
- In-Situ Chamber Plasma Cleaner-Hitachi
- SEM Stub Gripper-Hitachi
- Zeiss SEM Supplies
- Overview
- Calibration Standards Zeiss
- Zeiss SEM Holders
- Zeiss Sample Preparation Stands
- Zeiss Tungsten Filaments
- Zeiss Denka Lab6 Filaments
- Zeiss Denka 174 Schottky Emitters
- Vacuum Storage-Zeiss
- Zeiss Pin Stubs
- Sample Storage-Zeiss
- Zeiss SEM Holder Adapters
- Zeiss Particle Analysis Holders
- In-Situ Chamber Plasma Cleaner
- SEM Stub Gripper Tweezers-Zeiss
- Thermo-FEI SEM Supplies
- Overview Thermo-FEI Supplies
- Calibration Standards-Thermo-FEI
- Dual Beam TEM Grids
- Gallium LMIS-Thermo FEI
- Dual Beam Pre-Cursors
- Dual Beam TEM Grid Holders
- Dual Beam Low Profile Stubs
- FEI Dual beam EBSD-3D sample Holder
- Dual Beam Gallium Sources
- FESEM FEI XL & Sirion Source Changes
- Non Magnetic Sample Holders
- Phenom SEM Supplies-Thermo-FEI
- Phenom Tabletop SEM Stubs & Sample Holders
- SEM Sample Holders-Thermo-FEI
- SEM Pin Stubs-Thermo-FEI
- Stage Adapters-Thermo FEI
- Thermo-FEI Tungsten Filaments
- SEM Stub Grippers-Thermo-FEI
- Particle Analysis Holders-Thermo FEI
- TESCAN SEM Supplies
- Overview TESCAN SEM Supplies
- Sample Preparation Stands-TESCAN
- Calibration Standards-TESCAN
- TESCAN SEM Sample Holders
- TESCAN Tungsten Filaments
- TESCAN Denka Lab6 Cathode
- TESCAN Denka 174 TFE Emitters
- TESCAN Particle Analysis Holders
- TESCAN SEM Holder Adapters
- TESCAN SEM Stubs
- Sample Storage-TESCAN
- Vacuum Storage-TESCAN
- TESCAN FIB-SEM TEM Lift-Out Grids
- TESCAN FIB-SEM TEM Grid Holders
- TESCAN FIB-SEM Pre-Tilt Low Profile Stubs
- SEM Stub Gripper Tweezers-TESCAN
- Desktop SEM Supplies
- Vacuum Supplies
- Light Microscopy Supplies
- Sputter Targets
- Sample Storage
- SEM Stage Adapters
- Cryo Supplies
- Calibration Standards
- Dual Beam Supplies
- TEM Supplies
- AFM Supplies
- Lab Supplies
- SEM Sputter Coaters
- Safematic Supplies