Micro-Tec MTC-5 Multiple target calibration standard with 4 patterns, mounted op 25mm JEOL stub RS-MN-31-T33600-7

The Micro-Tec MTC-5 bright field multiple target calibration standard comprises accurately deposited bright chromium lines on a conductive ultra-flat silicon substrate. The MTC-5 has been designed for calibrating reflective light microscopes, stereo microscopes, optical quality control systems and low magnification SEM imaging. The Micro-Tec MTC-5 incorporates four distinct patterns:Circle patterns from 10µm to 5mm diameterSquare patterns from 10x10µm to 5x5mmHexagon patterns from 10µm to 5mm acrossCross scale patterns of 5x5mm with 0.01mm divisionsThe four chromium deposited patterns all in the same focus plane and provide a more superior signal compared to etched patterns. The Micro-Tec MTC-5 is a NIST traceable standard. Example of wafer level certificate of traceability for the Micro-Tec MTC-5 multiple target calibration standard.