EM-Tec FS21 FIB grid and sample holder for up to 2 FIB grids and Ø12.7mm pin stub, M4 RS-MN-12-000377

The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples. Includes 1x EM-Tec F12Z and 2x standard 12.7mm pin stubs.